Manufacturer | Part # | Datasheet | Description |
Texas Instruments
|
SN54LVT8980A |
871Kb/38P |
EMBEDDED TEST-BUS CONTROLLERS |
SN54LVTH18646A |
605Kb/38P |
3.3-V ABT SCAN TEST DEVICES |
SN54ABT8543 |
537Kb/31P |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
SN74BCT8373 |
293Kb/21P |
SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES |
SN54ABT18245 |
435Kb/30P |
SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS |
SN54ABT18502 |
487Kb/32P |
SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
SN54ABT8652 |
520Kb/31P |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
SN54ABTH18646A |
656Kb/41P |
SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
SN74SSTU32866A |
654Kb/35P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTUB32866 |
1Mb/39P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SCANSTA101 |
1Mb/39P |
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master |
74ABTH182652APMG4 |
580Kb/39P |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
74SSTUB32865 |
772Kb/21P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32865A |
773Kb/21P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTEB32866 |
1Mb/37P |
1.5V/1.8V 25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868A |
770Kb/25P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868 |
981Kb/26P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868 |
434Kb/23P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868A |
768Kb/26P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74LVTH18502A-EP |
935Kb/42P |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |